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International Conference on
Extended Defects in Semiconductors 19th - 24th September 2010 |
Sussex University Brighton, UK |
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The conference timetable is now available.
The biennial international conference on Extended Defects in Semiconductors
started in 1978 with a meeting in Hünfeld, Germany. Subsequent meetings
rotated between Poland, France, Great Britain, Germany, Russia and Italy,
culminating in EDS2004 in Chernogolovka, EDS2006 in Halle and EDS2008 in
Poitiers.
EDS2010 is to be held at the University of Sussex at Brighton, UK from
September 19th to 24th 2010.
The conference is a forum for the current state of the art of investigation
and modelling of extended defects in semiconductors. Scientists from
universities, research institutes and industry make contributions to a
deeper understanding of extended defects, their interaction with point
defects and their role in the development of semiconductor technology.
The remit of the conference includes extended defects, nanostructures,
nanoparticles, quantum dots and interfaces within semiconducting materials
ranging from narrow to wide band gaps, including graphene-derived materials
and diamond. Scientific interests range from defect geometry, electronic
structure, dynamics, spectroscopy, microscopy, reactions and chemistry to
introduction mechanisms, such as implantation and strained layers and the
operation of devices such as integrated circuits, heterostructures, and
solar cells.
EDS2010 will have two additional themes, firstly the structure and
properties of extended defects in carbon materials and secondly, a focus on
the work of Professor R Jones.
In conclusion, and most importantly, we note the passing of one of the
founders of this conference series, Prof. Dr. Helmut Alexander in
December last year, and we dedicate this meeting to his memory.
The official language of the conference will be English.
The conference will begin on Sunday evening (arrivals, drinks and buffet dinner) and end Friday lunchtime (depart).
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